掃描電鏡SEM (Scanning Electron Microscope) was designed for inspecting the topographies of specimens at very high magnifications. Currently the advanced FESEM (Field Emission Scanning Microscopes) can go to magnifications as high as 300,000X. Due to the operation flexibilities and good imaging capabilities, SEM has been widely used to inspect sample Topographies and Morphologies. ('~LMu_  
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