Outline of the contents: C-(O*hK
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1. Basic Interferometers for Optical Testing *[b~2
2. Phase-Shifting Interferometry *{=q:E$
3. Specialized Optical Tests mvyOwM
4. Long Wavelength Interferometry .Txwp?};
5. Testing of Aspheric Surfaces K3`48,`?wA
6. Measurement of Surface Microstructure l YjPrA]TC
7. Absolute Measurements jG,^~5x
8. Concluding Remarks